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180705 VCD Hintergrundpapier Verkehrstote und Verletzte Stand
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File link: https://www.vcd.org/filea...507_-_Version_Website.pdf
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Go To Link - 180705 VCD Hintergrundpapier Verkehrstote und Verletzte Stand
New approach for Post Silicon Verification on Automated Test
New approach for Post‐Silicon Verification on Automated Test Equipment Atsuo Sawara ADVANTEST Corp atsuo sawara@jp advantest com SujithKarunanayake Marvell Semiconductor Inc skarunan@marvell com
File link: http://www.svtest.com/201...r_Post-Silicon_on_ATE.pdf
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Go To Link - New approach for Post Silicon Verification on Automated Test
I know HDL Is that all I need to know for my career in
Languages: TCL CPF/UPF SDC VisualBasic TCF/VCD WGL/STIL etc Overview PD tools support standard scripting interface (CLI) for support of TCL etc Particular steps of the PD flow can be fully scripted and automated Some steps have to be done manually (PV Floorplanning manual routing RDL/bumps etc ) through GUI
File link: http://www.urel.feec.vutb..._ASIC_design_VUT_2012.pdf
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Go To Link - I know HDL  Is that all I need to know for my career in
Experience Execution and Integrity Test Spectrum
•Reads VCD and EVCD files •Generates WGL or STIL patterns •Batch mode converts multiple simulations Event Based Simulations 10 20 30 40 50 60 70 80 90 100 Cycle Based Patterns VectorPro Conditioning Event Mapping Cyclization Edgeset Matching Timing Generation Histogramming
File link: http://testspectrum.com/h...SI-Company-Overview-3.pdf
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Go To Link - Experience  Execution and Integrity   Test Spectrum
LSI Test Support System —'PreTestStation' Virtual Tester—
language but other languages such as MOST SUMMIT WGL and STIL can be converted into TDL using our converter software for making the most of the earlier test programs It is also possible to directly convert VCD (Value Change Dump) files which are dumps produced by the HDL logic simulator and popular with IC designers into test patterns
File link: https://web-material3.yokogawa.com/rd-tr-r00036-001.pdf
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Go To Link - LSI Test Support System —'PreTestStation' Virtual Tester—
Corporate Presentation ChipTest
Vector Conversion Tools for wgl stil & vcd patterns ATE with 128 Channel PS400 & MSDPS Resources Onsite Consultation & Engineering Assistance Closely Associated Partner for High End ATE Needs Mixed Signal & High Speed Digital Capability ATE with P1000 NP2500 AV8 & TIA Resources
File link: https://www.chiptest.net/...2017%202017%20-%20Net.pdf
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Go To Link - Corporate Presentation   ChipTest
Programmable High Speed Pxie Digital Io Card Model 33010
supported to cover WGL/STIL/VCD/EVCD conversions Addressing the emerging market and test cost challenges With a high density per pin and per site architecture full suite of ATE Pin Electronics (PE) card functions expandable channel count and a rich set of software support the 33010 digital IO card will help users address the
File link: http://www.chromaate.com/chroma/webdrive/catalogue/APP/33010-E.pdf
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Go To Link - Programmable High Speed Pxie Digital Io Card Model 33010
Agenda Chiptest Engineering LTD
Agenda www chiptest in 1 Test Services Advantest Capabilities Trained Engineering Manpower in 93K & T2K SoC systems Offline System with HpSmarTest for program development Vector Conversion Tools for wgl stil & vcd patterns ATE with 128 Channel PS400 & MSDPS Resources Onsite Consultation & Engineering Assistance
File link: http://www.chiptest.in/Ch...0-%20Sep%2021,%202016.pdf
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Go To Link - Agenda   Chiptest Engineering LTD
TestMAX Vtran synopsys com
WGL and IEEE 1450 (STIL) [Compatibility tested with TestMAX ATPG] • Verilog eVCD and VCD (value change dump) • Leading ATE vendor formats including: Advantest Teradyne LTX Credence Figure 1: View of waveforms generated by TestMAX Vtran
File link: https://www.synopsys.com/...eets/testmax-vtran-ds.pdf
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Go To Link - TestMAX Vtran   synopsys com